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On-Chip Measurement of Single-Event Transients in a 45 nm Silicon-on-Insulator Technology

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15 Author(s)
T. D. Loveless ; Institute for Space and Defense Electronics and the Department of Electrical Engineering and, Computer Science at Vanderbilt University, Nashville, TN, USA ; J. S. Kauppila ; S. Jagannathan ; D. R. Ball
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Author(s)

T. D. Loveless
Institute for Space and Defense Electronics and the Department of Electrical Engineering and, Computer Science at Vanderbilt University, Nashville, TN, USA
J. S. Kauppila ; S. Jagannathan ; D. R. Ball ; J. D. Rowe ; N. J. Gaspard ; N. M. Atkinson ; R. W. Blaine ; T. R. Reece ; J. R. Ahlbin ; T. D. Haeffner ; M. L. Alles ; W. T. Holman ; B. L. Bhuva ; L. W. Massengill