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The Prospect of STT-RAM Scaling From Readability Perspective

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3 Author(s)
Yaojun Zhang ; Department of Electrical and Computer Engineering,, University of Pittsburgh,, Pittsburgh,, USA ; Wujie Wen ; Yiran Chen

Author(s)

Yaojun Zhang
Department of Electrical and Computer Engineering,, University of Pittsburgh,, Pittsburgh,, USA
Wujie Wen ; Yiran Chen