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Statistical aging under dynamic voltage scaling: A logarithmic model approach

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6 Author(s)
Velamala, J.B. ; Sch. of ECEE, Arizona State Univ., Tempe, AZ, USA ; Sutaria, K. ; Shimizu, H. ; Awano, H.
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Author(s)

Velamala, J.B.
Sch. of ECEE, Arizona State Univ., Tempe, AZ, USA
Sutaria, K. ; Shimizu, H. ; Awano, H. ; Sato, T. ; Cao, Y.