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Power-Rail ESD Clamp Circuit With Ultralow Standby Leakage Current and High Area Efficiency in Nanometer CMOS Technology

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2 Author(s)
Chih-Ting Yeh ; Department of Electronics Engineering and the Institute of Electronics, National Chiao Tung University, Hsinchu, Taiwan ; Ming-Dou Ker

Author(s)

Chih-Ting Yeh
Department of Electronics Engineering and the Institute of Electronics, National Chiao Tung University, Hsinchu, Taiwan
Ming-Dou Ker