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Correlation Between Random Telegraph Noise and  \hbox {1}/f Noise Parameters in 28-nm pMOSFETs With Tip-Shaped SiGe Source/Drain

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8 Author(s)
Bo Chin Wang ; Institute of Microelectronics, the Department of Electrical Engineering, the Advanced Optoelectronic Technology Center, and the Center for Micro/Nano Science and Technology, National Cheng Kung University , Tainan, Taiwan ; San Lein Wu ; Chien Wei Huang ; Yu Ying Lu
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Author(s)

Bo Chin Wang
Institute of Microelectronics, the Department of Electrical Engineering, the Advanced Optoelectronic Technology Center, and the Center for Micro/Nano Science and Technology, National Cheng Kung University , Tainan, Taiwan
San Lein Wu ; Chien Wei Huang ; Yu Ying Lu ; Shoou Jinn Chang ; Yu Min Lin ; Kun Hsien Lee ; Osbert Cheng