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Negative-bias-temperature-instability and hot carrier effects in nanowire junctionless p-channel multigate transistors

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3 Author(s)
Jong Tae Park ; Department of Electronics Engineering, University of Incheon, #119 Academi-Ro, Yoonsu-Gu, Incheon, South Korea ; Young Kim, Jin ; Pierre Colinge, Jean

Author(s)

Jong Tae Park
Department of Electronics Engineering, University of Incheon, #119 Academi-Ro, Yoonsu-Gu, Incheon, South Korea
Young Kim, Jin ; Pierre Colinge, Jean