System Maintenance Notice:
Single article purchases and IEEE account management are currently unavailable. We apologize for the inconvenience.
By Topic

Quick repairing of defects inside telescoping multi-walled carbon nanotubes using contact resistance

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

The purchase and pricing options are temporarily unavailable. Please try again later.
5 Author(s)
Nakajima, M. ; Center For Micro-nano Mechatron., Nagoya Univ., Nagoya, Japan ; Ode, Y. ; Zhan Yang ; Saito, Y.
more authors

Author(s)

Nakajima, M.
Center For Micro-nano Mechatron., Nagoya Univ., Nagoya, Japan
Ode, Y. ; Zhan Yang ; Saito, Y. ; Fukuda, T.