By Topic

Scalability and Design-Space Analysis of a 1T-1MTJ Memory Cell for STT-RAMs

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

6 Author(s)
Richard Dorrance ; Department of Electrical Engineering, University of California, Los Angeles, CA, USA ; Fengbo Ren ; Yuta Toriyama ; Amr Amin Hafez
more authors

Author(s)

Richard Dorrance
Department of Electrical Engineering, University of California, Los Angeles, CA, USA
Fengbo Ren ; Yuta Toriyama ; Amr Amin Hafez ; Chih-Kong Ken Yang ; Dejan Markovic