Atomic force microscope (AFM) is primarily a tool for characterising surface topography, but there is also a strong interest in using AFM as a nanomanipulator to modify the sample surface or manipulate nanostructures. It is greatly important to understand the mechanics of AFM-based manipulation for efficient and reliable handling of nanoparticles. However, the microscopes for this kind of application have not been developed completely. During nanomanipulation process by AFM, the manipulation forces are measured according to cantilever deflection which is affected directly by spring constants of cantilever probe. Hence the cantilever probe is the most significant and sensitive component of the AFM. Typically, there are three cantilever types which are used for AFM, that is rectangular, V-shaped and dagger probes. In this Letter, the lateral, longitudinal and normal spring constants of the mentioned cantilever probes are analysed and discussed.