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Two-Mode Waveguide Characterization by Intensity Measurements from Exit Face Images

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2 Author(s)
Prieto-Blanco, X. ; Dept. de Fis. Aplic., Univ. de Santiago de Compostela, Santiago de Compostela, Spain ; Linares, J.

Author(s)

Prieto-Blanco, X.
Dept. de Fis. Aplic., Univ. de Santiago de Compostela, Santiago de Compostela, Spain
Linares, J.