By Topic

High-Performance 4H–SiC-Based Metal–Insulator–Semiconductor Ultraviolet Photodetectors With \hbox {SiO}_{2} and \hbox {Al}_{2}\hbox {O}_{3}\hbox {/}\hbox {SiO}_{2} Films

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

11 Author(s)
Feng Zhang ; Key Lab. of Semicond. Mater. Sci., Inst. of Semicond., Beijing, China ; Guosheng Sun ; Huolin Huang ; Zhengyun Wu
more authors

Author(s)

Feng Zhang
Key Lab. of Semicond. Mater. Sci., Inst. of Semicond., Beijing, China
Guosheng Sun ; Huolin Huang ; Zhengyun Wu ; Lei Wang ; Wanshun Zhao ; Xingfang Liu ; Guoguo Yan ; Liu Zheng ; Lin Dong ; Zeng, Yiping