Scheduled System Maintenance:
Some services will be unavailable Sunday, March 29th through Monday, March 30th. We apologize for the inconvenience.
By Topic

Effect of Transistor Density and Charge Sharing on Single-Event Transients in 90-nm Bulk CMOS

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

The purchase and pricing options are temporarily unavailable. Please try again later.
9 Author(s)
Atkinson, N.M. ; Vanderbilt Univ., Nashville, TN, USA ; Ahlbin, J.R. ; Witulski, A.F. ; Gaspard, N.J.
more authors