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A fine-grained technique of NBTI-aware voltage scaling and body biasing for standard cell based designs

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2 Author(s)
Yongho Lee ; Syst. LSI, Samsung Electron., Yongin, South Korea ; Taewhan Kim

Author(s)

Yongho Lee
Syst. LSI, Samsung Electron., Yongin, South Korea
Taewhan Kim