A new matrix-based approach for de-embedding the noise figure of a differential device has been recently presented. In this paper, an enhancement to this method will be provided. The new method will be compared to state-of-the-art approaches. For comparison, measurements have been performed on an amplifier with distinct transfer characteristics. The respective integrated circuit is composed of two single-ended amplifiers placed in close proximity within the layout. Due to capacitive cross-couplings arising from this arrangement, the differential noise figure is degraded compared to the single-ended one, which indicates the requirement of differential excitation. For completion, measurements have also been performed on a differential device. A commercially available evaluation board has been used for this purpose and measurement results agree well with those specified by the manufacturer.