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Impact of Surface Orientation on the Sensitivity of FinFETs to Process Variations—An Assessment Based on the Analytical Solution of the Schrödinger Equation

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2 Author(s)
Yu-Sheng Wu ; Dept. of Electron. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan ; Pin Su

Author(s)

Yu-Sheng Wu
Dept. of Electron. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan
Pin Su