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Evaluating Complexity, Code Churn, and Developer Activity Metrics as Indicators of Software Vulnerabilities

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4 Author(s)
Yonghee Shin ; Coll. of Comput. & Digital Media, DePaul Univ., Chicago, IL, USA ; Meneely, A. ; Williams, L. ; Osborne, J.A.

Author(s)

Yonghee Shin
Coll. of Comput. & Digital Media, DePaul Univ., Chicago, IL, USA
Meneely, A. ; Williams, L. ; Osborne, J.A.