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A Novel Test Application Scheme for High Transition Fault Coverage and Low Test Cost

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2 Author(s)
Zhen Chen ; Dept. of Comput. Sci. & Technol., Tsinghua Univ., Beijing, China ; Dong Xiang

Author(s)

Zhen Chen
Dept. of Comput. Sci. & Technol., Tsinghua Univ., Beijing, China
Dong Xiang