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Comprehensive Noise Characterization and Modeling for 65-nm MOSFETs for Millimeter-Wave Applications

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8 Author(s)
Sheng-Chun Wang ; Department of Electronics Engineering, National Chiao Tung University, National Nano Device Laboratories, Hsinchu 300, R.O.C.R.O.C. ; Pin Su ; Kun-Ming Chen ; Kuo-Hsiang Liao
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Author(s)

Sheng-Chun Wang
Department of Electronics Engineering, National Chiao Tung University, National Nano Device Laboratories, Hsinchu 300, R.O.C.R.O.C.
Pin Su ; Kun-Ming Chen ; Kuo-Hsiang Liao ; Bo-Yuan Chen ; Sheng-Yi Huang ; Cheng-Chou Hung ; Guo-Wei Huang