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Comparative Study of Quick Electron Detrapping and Random Telegraph Signal and Their Dependences on Random Discrete Dopant in Sub-40-nm NAND Flash Memory

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6 Author(s)
Taehoon Kim ; Micron Technol., Inc., Boise, ID, USA ; Deping He ; Porter, R. ; Rivers, D.
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Author(s)

Taehoon Kim
Micron Technol., Inc., Boise, ID, USA
Deping He ; Porter, R. ; Rivers, D. ; Kessenich, J. ; Goda, A.