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Sizing of 3-D Arbitrary Defects Using Magnetic Flux Leakage Measurements

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5 Author(s)
Ravan, M. ; Dept. of Electr. & Comput. Eng., McMaster Univ., Hamilton, ON, Canada ; Amineh, R.K. ; Koziel, S. ; Nikolova, N.K.
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Author(s)

Ravan, M.
Dept. of Electr. & Comput. Eng., McMaster Univ., Hamilton, ON, Canada
Amineh, R.K. ; Koziel, S. ; Nikolova, N.K. ; Reilly, J.P.