By Topic

A complex x-ray structure characterization of Ge thin film heterostructures integrated on Si(001) by aspect ratio trapping and epitaxial lateral overgrowth selective chemical vapor deposition techniques

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

The purchase and pricing options are temporarily unavailable. Please try again later.
5 Author(s)
Zaumseil, P. ; IHP, Im Technologiepark 25, 15236 Frankfurt (Oder), Germany ; Schroeder, T. ; Park, Ji-Soo ; Fiorenza, J.G.
more authors

Author(s)

Zaumseil, P.
IHP, Im Technologiepark 25, 15236 Frankfurt (Oder), Germany
Schroeder, T. ; Park, Ji-Soo ; Fiorenza, J.G. ; Lochtefeld, A.