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Recombination lifetimes and surface recombination velocities of minority carriers in n‐p junctions. A new method for their determination by means of a stationary amplitude‐modulated electron beam

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1 Author(s)
von Roos, Oldwig ; Jet Propulsion Laboratory, California Institute of Technology, Pasadena, California 91103

Author(s)

von Roos, Oldwig
Jet Propulsion Laboratory, California Institute of Technology, Pasadena, California 91103

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