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Impact of Gate Leakage on Performances of Phase-Locked Loop Circuit in Nanoscale CMOS Technology

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2 Author(s)
Jung-Sheng Chen ; Power Conversion Taiwan, Fairchild Semicond. Corp., Hsinchu, Taiwan ; Ming-Dou Ker

Author(s)

Jung-Sheng Chen
Power Conversion Taiwan, Fairchild Semicond. Corp., Hsinchu, Taiwan
Ming-Dou Ker

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