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Escape depth of secondary electrons induced by ion irradiation of submicron diamond membranes

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5 Author(s)
Richter, V. ; Solid-State Institute, Technion-Israel Institute of Technology, Haifa 32000, Israel ; Fizgeer, B. ; Michaelson, Sh. ; Hoffman, A.
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Author(s)

Richter, V.
Solid-State Institute, Technion-Israel Institute of Technology, Haifa 32000, Israel
Fizgeer, B. ; Michaelson, Sh. ; Hoffman, A. ; Kalish, R.