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Effect of critical thickness on structural and optical properties of InxGa1-xN/GaN multiple quantum wells

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5 Author(s)
Lu, W. ; Beijing Laboratory of Electron Microscopy, Institute of Physics and Center for Condensed Matter Physics, Chinese Academy of Sciences, P.O. Box 603, Beijing 100080College of Materials Science and Engineering, Jilin University, Changchun 130023, China ; Li, D.B. ; Li, C.R. ; Shen, F.
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Author(s)

Lu, W.
Beijing Laboratory of Electron Microscopy, Institute of Physics and Center for Condensed Matter Physics, Chinese Academy of Sciences, P.O. Box 603, Beijing 100080College of Materials Science and Engineering, Jilin University, Changchun 130023, China
Li, D.B. ; Li, C.R. ; Shen, F. ; Zhang, Z.