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A combined x-ray specular reflectivity and spectroscopic ellipsometry study of CeO2/yttria-stabilized-zirconia bilayers on Si(100) substrates

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7 Author(s)
Mechin, L. ; Département de Recherche Fondamentale sur la Matière Condensée, SPSMS/LCP, CEA Grenoble, 17 rue des Martyrs, 38054 Grenoble Cedex 09, France ; Chabli, A. ; Bertin, F. ; Burdin, M.
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Author(s)

Mechin, L.
Département de Recherche Fondamentale sur la Matière Condensée, SPSMS/LCP, CEA Grenoble, 17 rue des Martyrs, 38054 Grenoble Cedex 09, France
Chabli, A. ; Bertin, F. ; Burdin, M. ; Rolland, G. ; Vannuffel, C. ; Villegier, J.-C.