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Field-induced strain under load in Ni–Mn–Ga magnetic shape memory materials

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6 Author(s)
Murray, S.J. ; Massachusetts Institute of Technology, Cambridge, Massachusetts 02139 ; Farinelli, M. ; Kantner, C. ; Huang, J.K.
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Author(s)

Murray, S.J.
Massachusetts Institute of Technology, Cambridge, Massachusetts 02139
Farinelli, M. ; Kantner, C. ; Huang, J.K. ; Allen, S.M. ; OHandley, R.C.