Skip to Main Content
IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards,
eBooks, and eLearning courses.
Learn more about:
IEEE Xplore subscriptions
Your organization might have access to this article on the publisher's site. To check,
click on this link:http://dx.doi.org/+10.1063/1.367642
We have developed a novel form of magnetic force microscopy that uses a commercial piezoelectric quartz tuning fork to detect magnetic forces and force gradients. Such a detection system is extremely simple and inexpensive, compared to conventional optical methods of cantilever vibration detection. The setup is, in addition, characterized by small size, which makes it attractive for studies done in constrained spaces. The instrument is first described, then theoretical comparison of signal to noise ratio and resolution is made with the conventional optical detection techniques of cantilever vibration, and finally, first images of thin film media commercial hard disk magnetic bit transitions, point response of magnetoresistive elements, and field gradients above the write gap of a commercial hard disk head are presented. © 1998 American Institute of Physics.
A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.