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Statistical models for charge collection efficiency and variance in semiconductor spectrometers

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2 Author(s)
Ruzin, A. ; Kidron Microelectronics Research Center, Department of Electrical Engineering, Technion–Israel Institute of Technology, Haifa 32000, Israel ; Nemirovsky, Y.

Author(s)

Ruzin, A.
Kidron Microelectronics Research Center, Department of Electrical Engineering, Technion–Israel Institute of Technology, Haifa 32000, Israel
Nemirovsky, Y.

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