A cell has been designed and fabricated for in situ characterization of catalysts and environmental materials using soft x-ray absorption spectroscopy and spectromicroscopy at photon energies above 250eV. “Lab-on-a-chip” technologies were used to fabricate the cell on a glass wafer. The sample compartment is 1.0mm in diameter and has a gas path length of 0.8mm to minimize x-ray absorption in the gas phase. The sample compartment can be heated to 533K by an Al resistive heater and gas flows up to 5.0cm3min-1 can be supplied to the sample compartment through microchannels. The performance of the cell was tested by acquiring CuL3-edge x-ray appearance near-edge structure (XANES) data during the reduction and oxidation of a silica-supported Cu catalyst using the beam line 11.0.2 scanning transmission x-ray microscope (STXM) at the Advanced Light Source of Lawrence Berkeley National Laboratory (Berkeley, CA). Two-dimensional images of individual catalyst particles were recorded at photon energies between 926 and 937eV, the energy range in which the Cu(II) and Cu(I)L3 absorption edges are observed. Oxidation state specific images of the catalyst clearly show the disappearance of Cu(II) species during the exposure of the oxidized sample to 4% CO in He while increasing the temperature fro- m 308 to 473K. Reoxidation restores the intensity of the image associated with Cu(II). CuL3-edge XANES spectra obtained from stacks of STXM images show that with increasing temperature the Cu(II) peak intensity decreases as the Cu(I) peak intensity increases.