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ac driving amplitude dependent systematic error in scanning Kelvin probe microscope measurements: Detection and correction

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2 Author(s)
Yan Wu ; Department of Mechanical and Industrial Engineering, University of Illinois at Urbana-Champaign, 1206 West Green Street, Urbana, Illinois 61801 ; Shannon, M.A.

Author(s)

Yan Wu
Department of Mechanical and Industrial Engineering, University of Illinois at Urbana-Champaign, 1206 West Green Street, Urbana, Illinois 61801
Shannon, M.A.