Cart (Loading....) | Create Account
Close category search window
 

Scanning capacitance microscopy: Quantitative carrier profiling down to nanostructures

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

7 Author(s)
Giannazzo, F. ; CNR-IMM, sezione di Catania, Stradale Primosole 50, 95121 Catania, Italy ; Raineri, V. ; Mirabella, S. ; Impellizzeri, G.
more authors

Author(s)

Giannazzo, F.
CNR-IMM, sezione di Catania, Stradale Primosole 50, 95121 Catania, Italy
Raineri, V. ; Mirabella, S. ; Impellizzeri, G. ; Priolo, F. ; Fedele, M. ; Mucciato, R.

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.