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Novel high vacuum scanning force microscope using a piezoelectric cantilever and the phase detection method

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5 Author(s)
Jiaru Chu ; Research Center for Advanced Science and Technology, The University of Tokyo, Komaba 4-6-1, Meguro-ku, Tokyo 153, Japan ; Itoh, T. ; Lee, Chengkuo ; Suga, T.
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Author(s)

Jiaru Chu
Research Center for Advanced Science and Technology, The University of Tokyo, Komaba 4-6-1, Meguro-ku, Tokyo 153, Japan
Itoh, T. ; Lee, Chengkuo ; Suga, T. ; Watanabe, Kazutoshi