By Topic

Real-time, in situ spectroscopic ellipsometry for analysis of the kinetics of ultrathin oxide-film growth on MgAl alloys

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

The purchase and pricing options are temporarily unavailable. Please try again later.
3 Author(s)
Vinodh, M.S. ; Max Planck Institute for Metals Research, Heisenbergstraße 3, D-70569 Stuttgart, Germany ; Jeurgens, L.P.H. ; Mittemeijer, E.J.

Author(s)

Vinodh, M.S.
Max Planck Institute for Metals Research, Heisenbergstraße 3, D-70569 Stuttgart, Germany
Jeurgens, L.P.H. ; Mittemeijer, E.J.