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Determination of structural parameters in heterojunction bipolar transistors by x-ray diffraction with (002) reflection

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8 Author(s)
Shen, A. ; Nortel Networks, P.O. Box 3511, Station C, Ottawa, Ontario K1Y 4H7, Canada ; Griswold, E.M. ; Hillier, G. ; Dang, L.
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Author(s)

Shen, A.
Nortel Networks, P.O. Box 3511, Station C, Ottawa, Ontario K1Y 4H7, Canada
Griswold, E.M. ; Hillier, G. ; Dang, L. ; Kuhl, A. ; Ares, R. ; Clark, D. ; Calder, I.D.