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Tracking of conduction phenomena and degradation in organic light emitting diodes by current noise measurements

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7 Author(s)
Sampietro, M. ; Politecnico di Milano, Dip. Elettronica e Informazione, P.za L. da Vinci 32, 20133 Milano, Italy ; Ferrari, G. ; Natali, D. ; Scherf, U.
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Author(s)

Sampietro, M.
Politecnico di Milano, Dip. Elettronica e Informazione, P.za L. da Vinci 32, 20133 Milano, Italy
Ferrari, G. ; Natali, D. ; Scherf, U. ; Annan, K.O. ; Wenzl, F.P. ; Leising, G.