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A quantitative study of the relationship between the oxide charge trapping over the drain extension and the off-state drain leakage current

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5 Author(s)
Huang, Jiayi ; School of Electrical & Electronic Engineering, Nanyang Technological University, Nanyang Avenue, Singapore 639798, Singapore ; Chen, T.P. ; Ang, C.H. ; Manju, S.
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Author(s)

Huang, Jiayi
School of Electrical & Electronic Engineering, Nanyang Technological University, Nanyang Avenue, Singapore 639798, Singapore
Chen, T.P. ; Ang, C.H. ; Manju, S. ; Fung, S.