Skip to Main Content
IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards,
eBooks, and eLearning courses.
Learn more about:
IEEE Xplore subscriptions
Your organization might have access to this article on the publisher's site. To check,
click on this link:http://dx.doi.org/+10.1063/1.1499736
The absolute values of the force exerted by the fiber probe of a scanning near-field optical microscope onto the surface were measured using an atomic force microscope in ambient conditions. We demonstrate that a usually neglected static attraction force is dominant at small dither amplitudes and is of the order of 200 nN. The tapping component of the force, often referred to as shear force, is of the order of 1 nN at these conditions for both the tuning fork-based and optical in resonance detection schemes. Other peculiarities of the shear force interaction are also discussed. © 2002 American Institute of Physics.
A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.