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Tip traveling and grain boundary effects in domain formation using piezoelectric force microscopy for probe storage applications

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8 Author(s)
Yunseok Kim ; Korea Advanced Institute of Science and Technology, Daejeon 305-701, Korea ; Cho, Youngsang ; Hong, Seungbum ; Buhlmann, Simon
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Author(s)

Yunseok Kim
Korea Advanced Institute of Science and Technology, Daejeon 305-701, Korea
Cho, Youngsang ; Hong, Seungbum ; Buhlmann, Simon ; Park, Hongsik ; Min, Dong-Ki ; Kim, Seung-Hyun ; No, Kwangsoo

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