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Loss of photocurrent efficiency in low mobility semiconductors: Analytic approach to space charge effects

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2 Author(s)
Tessler, Nir ; Microelectronic & Nanoelectronic Center, Electrical Engineering Department, Technion Israel Institute of Technology, Haifa 32000, Israel ; Rappaport, Noam

Author(s)

Tessler, Nir
Microelectronic & Nanoelectronic Center, Electrical Engineering Department, Technion Israel Institute of Technology, Haifa 32000, Israel
Rappaport, Noam