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Threshold Voltage and 1/f Noise Degradation in Carbon Nanotube Field Effect Transistors under Hot-Carrier Stress

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5 Author(s)
Paul Lim ; Center for Integrated Systems, Stanford University, Stanford, CA 94305, Email: lim@snow.stanford.edu: Phone: (650) 723-1926 ; Xinran Wang ; Hongjie Dai ; Yoshio Nishi
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Author(s)

Paul Lim
Center for Integrated Systems, Stanford University, Stanford, CA 94305, Email: lim@snow.stanford.edu: Phone: (650) 723-1926
Xinran Wang ; Hongjie Dai ; Yoshio Nishi ; James Harris