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A Unified Approach for Full Chip Statistical Timing and Leakage Analysis of Nanoscale Circuits Considering Intradie Process Variations

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3 Author(s)
Sarvesh Bhardwaj ; Synopsys Inc., Mountain View, CA ; Sarma Vrudhula ; Amit Goel


Sarvesh Bhardwaj
Synopsys Inc., Mountain View, CA
Sarma Vrudhula ; Amit Goel