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The Impact of Gate-Oxide Breakdown on Common-Source Amplifiers With Diode-Connected Active Load in Low-Voltage CMOS Processes

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2 Author(s)
Jung-Sheng Chen ; Nat. Chiao-Tung Univ., Hsinchu ; Ming-Dou Ker

Author(s)

Jung-Sheng Chen
Nat. Chiao-Tung Univ., Hsinchu
Ming-Dou Ker