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Estimation of Single Event Transient Voltage Pulses in VLSI Circuits From Heavy-Ion-Induced Transient Currents Measured in a Single MOSFET

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3 Author(s)
Daisuke Kobayashi ; Japan Aerosp. Exploration Agency, Kanagawa ; Hirobumi Saito ; Kazuyuki Hirose

Author(s)

Daisuke Kobayashi
Japan Aerosp. Exploration Agency, Kanagawa
Hirobumi Saito ; Kazuyuki Hirose