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ESD-Protection Design With Extra Low-Leakage-Current Diode String for RF Circuits in SiGe BiCMOS Process

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3 Author(s)
Ming-Dou Ker ; Inst. of Electron., Nat. Chiao Tung Univ., Hsinchu ; Yuan-Wen Hsiao ; Woei-Lin Wu

Author(s)

Ming-Dou Ker
Inst. of Electron., Nat. Chiao Tung Univ., Hsinchu
Yuan-Wen Hsiao ; Woei-Lin Wu