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Charged particle effects on optoelectronic devices and bit error rate measurements on 400 Mbps fiber based data links

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3 Author(s)
Marshall, P. ; Naval Res. Lab., Washington, DC, USA ; Dale, C. ; LaBel, K.

Author(s)

Marshall, P.
Naval Res. Lab., Washington, DC, USA
Dale, C. ; LaBel, K.