By Topic

Using process experienced correlation table to improve the accuracy and reliability of data mining for yield improvement

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

6 Author(s)
Haw-Jyue Luo ; Powerchip Semicond. Corp., Nat. Tsing Hua Univ., Hsinchu ; Wang, S.R. ; Pei-Nong Chen ; Hung-En Tai
more authors

Author(s)

Haw-Jyue Luo
Powerchip Semicond. Corp., Nat. Tsing Hua Univ., Hsinchu
Wang, S.R. ; Pei-Nong Chen ; Hung-En Tai ; Chen-Fu Chien ; Pei-Nong Chen