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Model-driven techniques for evaluating the QoS of middleware configurations for DRE systems

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4 Author(s)
A. S. Krishna ; Dept. of Electr. Eng. & Comput. Sci., Vanderbilt Univ., Nashville, TN, USA ; E. Turkay ; Aniruddha Gokhale ; D. C. Schmidt

Author(s)

A. S. Krishna
Dept. of Electr. Eng. & Comput. Sci., Vanderbilt Univ., Nashville, TN, USA
E. Turkay ; Aniruddha Gokhale ; D. C. Schmidt