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Scanning voltage microscopy on active semiconductor lasers: the impact of doping profile near an epitaxial growth interface on series resistance

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6 Author(s)
Dayan Ban ; Dept. of Electr. & Comput. Eng., Univ. of Toronto, Ont., Canada ; Sargent, E.H. ; Dixon-Warren, St.J. ; Hinzer, K.
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Author(s)

Dayan Ban
Dept. of Electr. & Comput. Eng., Univ. of Toronto, Ont., Canada
Sargent, E.H. ; Dixon-Warren, St.J. ; Hinzer, K. ; White, J.K. ; SpringThorpe, A.J.