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Data retention characteristics of sub-100 nm NAND flash memory cells

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4 Author(s)
Jae-Duk Lee ; Res. & Dev. Center, Samsung Electron. Co., Gyunggi, South Korea ; Jeong-Hyuk Choi ; Donggun Park ; Kinam Kim

Author(s)

Jae-Duk Lee
Res. & Dev. Center, Samsung Electron. Co., Gyunggi, South Korea
Jeong-Hyuk Choi ; Donggun Park ; Kinam Kim